субота, 16 січня 2016 р.

Integrated Imaging and Vision Techniques for Industrial Inspection: Advances and Applications (Advances in Computer Vision and Pattern Recognition) by Zheng Liu (Editor), Hiroyuki Ukida (Editor), Pradeep Ramuhalli (Editor), Kurt Niel (Editor) PDF

Integrated Imaging and Vision Techniques for Industrial Inspection: Advances and Applications (Advances in Computer Vision and Pattern Recognition) by Zheng Liu (Editor), Hiroyuki Ukida (Editor), Pradeep Ramuhalli (Editor), Kurt Niel (Editor)


Product Details:

Author(s): Zheng Liu (Editor), Hiroyuki Ukida (Editor), Pradeep Ramuhalli (Editor), Kurt Niel (Editor)

Publisher: --

Category: Algorithms

Date: 24.09.2015

Pages: 541

Language: English

ISBN-10: 1447167406

ISBN-13: 9781447167402

Format: pdf

Book Description:

This pioneering text/reference presents a detailed focus on the use of machine vision techniques in industrial inspection applications. An internationally renowned selection of experts provide insights on a range of inspection tasks, drawn from their cutting-edge work in academia and industry, covering practical issues of vision system integration for real-world applications. Topics and features: Presents a comprehensive review of state-of-the-art hardware and software tools for machine vision, and the evolution of algorithms for industrial inspection Includes in-depth descriptions of advanced inspection methodologies and machine vision technologies for specific needs Discusses the latest developments and future trends in imaging and vision techniques for industrial inspection tasks Provides a focus on imaging and vision system integration, implementation, and optimization Describes the pitfalls and barriers to developing successful inspection systems for smooth and efficient manufacturing process Bridging the gap between theoretical knowledge and engineering practice, this indispensable book will appeal to graduate students interested in imaging, machine vision, and industrial inspection. The work also serves as an excellent reference for researchers seeking to develop innovative solutions to tackle practical challenges, and for professional engineers who will benefit from the coverage of applications at both system and component level.

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